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October 22, 2018 | Direct electron detection and x-ray analysis bring new possibilities for materials characterization in the EICN - California NanoSystems Institute
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LivUniSEMSRF on Twitter: "(3/7) An X-Max 50 mm2 EDS detector (Oxford Instruments) for high resolution chemical analysis of samples. Point analyses, chemical profiles (linescans) and maps can all be collected using the
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